Adeline Feybesse
Reliability and Quality Engineer, Freescale Semiconductor
Product Quality and reliability Engineer since 2 years. Expert in automotive reliability
•New standard developement support (AEC...)
•Methodology developement (comparative method, normalization distribution check.)
•Implementation and support of implementation of quality tools on several projects (DFMEA…)
•New technology development support interm of reliability validation
•Automotive product qualification support
•Team work with assembly, manufacturing, technology development, test, application, design, project management, characterization team. International work with American, Chinese, Russian, Czech, Korean and German people.
2003 - 2009•Implementation of quality tools on several projects (Tramx, DFMEA, Errata sheet…)
•New technology development support
•Automotive product qualification support and planning.
•Product production start support and yield improvement
•Team work with assembly, manufacturing, technology development, test, application, design, project management, characterization team. International work with American, Chinese, Russian, Czech, Korean and German people.
1999 - 2003“ Vertical power MOSFET development and optimization by use of simulations for the automotive sector (42V BATTERY)” (CIFRE contract with MOTOROLA SPS Toulouse & LAAS/CNRS)
•Patent on a new concept of power MOS transistor,,
•Electrical characterization of Mechatronics device,
•Scientific articles publication (ISPS'02, Microelectronics Reliability, GEET'02, JNRDM'01),
•Cooperation with other Motorola sites (US, China), research laboratory (LAAS/CNRS), industry partners (EPSILON INGÉNIÉRIE, ASEKR in Korea).
1997 - 1999“Study of 4 layers switches behaviors according to the IEC 1000-4-4 standard. Application to ACS and TRIAC” (Final training for DEA degrees and optional license and master training at ST-Microelectronics )
•IEC standard analysis et normalized test bench development
•Study of 4 layers switches behaviors according to the IEC 1000-4-4 standard, (electromagnetic susceptibility),
•Performance in term of power and EMC behaviors of different power supply circuit,
•Scientific articles publication (CEM 2000, IMACS CSCC'1999, EMC'99),,
•Cooperation with research laboratory (L.M.P.).