Enric Garcia-Caurel
Chercheur, Ecole polytechnique / Laboratoire LPICM
=== e-mail: enric.garcia-caurel@polytechnique.edu ===
=== CV / resume https://ishare.sphorium.com/vd/link.aspx?id=1e6...
Motivation
I'm seeking opportunities as technology consultant with spectial interest in the areas of optics, photonics, solar energy generation and micro-electronics industry.
Basic information
Born in Barcelona, Spain, in 1974
Education
PhD in Physics, University of Barcelona, Spain, in 2001
Idioms
Spanish: mother language
Catalan, French, English: fluent
Mandarin(chinese): notions
Main professional position
Researcher at Ecole Polytechnique, France, from 2004
Main professional activity (LPICM, Ecole Polytechnique)
- Research in Ellipsometry and Polarimetry for Materials Characterization
- Research and Development of new optical instruments in collaboration with HORIBA Jobin-Yvon
- Exploration of new applications of polarized light
Teaching
- SUPELEC - Associate Professor in Electronics & Solid State Physics
- Telecom & Management SudParis - Associate Professor in Optics
Proud member of
- SFO, Société Française d'Optique - http://www.sfoptique.org
- Photonics21 http://www.photonics21.org/index.php
- SPIE
Publications
- 3 international patents
- Editor of a proceedings book "Advanded Polarimetric Instrumentation" API09 http://www.epj-conferences.org/index.php?option...
- 1 chapter in a specialized book
- More than 50 publications (international journals and conferences)
go here for more details -> http://softs.polytechnique.fr/dsi/ksup/HAL/inde...
MISSIONS
- R&D of optical instrumentation
- Development of new application for polarized light
- Chief of the optical characterization facility of my lab
- Supervision of graduate students and technical personnel
ACHIEVEMENTS
- Development and industrial transfer of a liquid crystal based spectroscopic ellipsometer
- Development of a new deep ultraviolet (DUV) UV-VIS spectroscopic ellipsometer
- Development of a new broadband ellipsometer in the mid and far infrared.
- Study of the optical properties of different materials (thin films) silicon – diamond
- Metrology of nanostructurated objects – Diffraction gratings and photonic structures
