Cedric Hottier
Design Engineer, Philips semiconductors
JULY 2006 ...
NXP Seoul
Work as application engineer for NXP main customer : Samsung.
After 5 years spent in Design, I decided to look into the software side.
I am now in charge of the support of the integration of our software BlueTooth solution into Samsung solution.
N0V 2005 – FEB 2006
RUNCOM (A PHILIPS SEMICONDUCTORS CUSTOMER)
Tel Aviv, Israel
· Collaborated in Runcom’s integration and verification of various IPs in the RNA201 ARM sub system
(RNA201 is the WIBRO Runcom soc solution)
Among these IPs: PCI, USB, UART, DMAC, MPMC, multi layer AHB, ARM1136.
· Developed Runcom’s ARM1136 data and instruction cache test in assembly
Samsung, promoter of the WIBRO/WIMAX standard, is Runcom’s main customer.
AUG 2000 - OCT 2005
PHILIPS SEMICONDUCTORS SOPHIA Antipolis, France
I worked on Philips’ BlueTooth baseband chips PCF87750, PCF87752, PCF87755, PCF87852, PCF87860(CMOS 90) / BGB204 In Business Line Connectivity. Among these projects, I did the following activities:
· Designed the PCF87755 ARM sub-system.
This ARMSS contains two masters: one ARM7+ETM7 and one EBC (Ericsson BlueTooth Core) and various slaves as System Clock Unit, VPB bridge, SRAM controller.
· Supervised the design of the System Configuration Unit (SCU) for the PCF87852 (300KGates – CMOS 18 shrink)
SCU is the clock and reset generator. Low power and testability were the main challenges of this design.
· Designed other IPs: from objective specifications to netlist and lab validation on silicon
-DBUS interface
-Patch mechanism on ASB and AHB bus to allow ROM chip to be patched
· Developed test benches in VHDL/C/Assembly
to validate the integration of the Ericsson BlueTooth core in Philips Baseband
-Voice path from PCM interface to BlueTooth packets (CVSD encoding)
-Low power mode simulations
-Data path from UART to BlueTooth packets
· Developed a Speed Test for PCF87852 chip through the JTAG interface to detect non working tested chip, to improve the quality of our product
· Defined and led the execution of the RTL and Gate level simulation plan for the PCF87755, PCF87852, PCF87860 basebands
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