Mohamed SAIB
Research staff member, ASELTA NANOGRAPHICS
38GrenobleRhône-Alpes - France
13 contactsDepuis 2011
Topic : "Monitoring of electron beam lithography process"
Editeurs logiciels
Expérience professionnelle
Postdoctoral associate, Laboratory of Microelectronics Technologies, Minatec-CEA-CNRS, Grenoble, France
2009 - 2011Topic : “Scatterometry optimization for the real time applications”
Enseignement - Animation - Recherche
Postdoctoral associate, Laboratory of Microelectronics Technologies, Minatec-CEA-CNRS, Grenoble, France
2008 - 2009Topic: “Design, implementation and validation of a prototype of high efficiency extreme ultraviolet interferometer for lithography”
Recherche et développement
PhD in Electronics and Microelectronics, specialization: Instrumentation, Instrumentation Laboratory, Basse Normandie University, Caen, France
2003 - 2007Thesis title: “Magneto-optical imaging of the magnetization reversal process in La0. 7Sr0.3MnO3 thin layers”
Universités et grandes écoles
Ancien élève de