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Emmanuel LE BOULBAR

BRISTOL

En résumé

-Materials growth: PLD pico- and nanosecond, knowledge in plasma deposition (MOCVD, PECVD, rf magnetron...)
- Microscopy: surface and cross sectional Scanning Electron Microspopy on wide gap semiconductor
- Crystallography: X ray diffraction on powders and thin layers (Pole figure, rocking curve, epitaxial relation), Ignition to crystalline structure determination by indexation method
- Spectroscopy: UV-Visible absorption (optical gap identification), lanthanide ions spectroscopy (energy transfer from one matrix to doping ions, local environment influence, crystalline field effect, quenching, photoluminescence measurements)
- Semiconductor: Identification of carriers using Hall Effect, PN junction characteristics, transitions from metal to semiconductor, training in thermal conductivity determination

Mes compétences :
Couches minces
Electronique
matériaux
Nanotechnologie
Photovoltaïque

Entreprises

  • University of Bath - Research Officer

    2010 - maintenant
  • Rhodia Electronics and catalysis - Stagiaire R&D

    2007 - 2007 Relationship between oxides colours, structure and properties for catalyst applications in cars pollution
    - To set up and validate of a size and constraint analysis method called Williamson-Hall
    - To optically characterize oxide using diffused reflection measurements
    - Training on magnetic susceptibility measurements (SQUID method)
  • University of Orleans GREMI - PhD

    2007 - 2010 To grow TiOx epitaxial films – To identify and define the film structure – To define the epitaxial relationship between films and substrates

    To define the structure and the optical and electrical properties of the transparent conducting oxide layers – To design and to characterize transparent p-n homo and heterojunction

    To grow TiO2 doped rare earths ions thin films to convert UV photon into near infrared photon
  • Istituto Nazionale di Ricerca Metrologica (I.N.RI.M), Turin, Italie - Stagiaire R&D

    2006 - 2006 Modeling and creation of a pored silicon based microcavity for ethanol sensors application
    - Use of Scout98 (Modeling software for optical phenomena)
    - UV-visible and IR spectroscopy – To optically characterize silicon and porous silcon (refraction index, dielectrical function)

Formations

Réseau

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